B12-O-02Observation of Dominant Diffusion Path of Copper in...

B12-O-02Observation of Dominant Diffusion Path of Copper in the Electrically Biased Interconnects using in-situ TEM

Oh, Young-Hwa, Lee, Seung-Yong, Ahn, Tae-Young, Kim, Miyoung, Kim, Young-Woon
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
64
Language:
english
Journal:
Microscopy
DOI:
10.1093/jmicro/dfv089
Date:
November, 2015
File:
PDF, 631 KB
english, 2015
Conversion to is in progress
Conversion to is failed