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B13-P-05In-situ scanning electron microscopy observation of electric field induced domain switching behavior in ferroelectric materials
Jo, Kyu-Jin, Cha, Hyun-Woo, Lee, Joon-Hwan, Kim, Mi-Yang, Yang, Cheol-WoongVolume:
64
Language:
english
Journal:
Microscopy
DOI:
10.1093/jmicro/dfv240
Date:
November, 2015
File:
PDF, 629 KB
english, 2015