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Annealing effect on the electrical activity of extended defects in plastically deformed p-Si with low dislocation density
O. V. Feklisova, B. Pichaud, E. B. YakimovVolume:
202
Year:
2005
Language:
english
Pages:
5
DOI:
10.1002/pssa.200460511
File:
PDF, 159 KB
english, 2005