White X-ray microbeam analysis of strain and crystallographic tilt in GaN layers grown by maskless pendeoepitaxy
R. I. Barabash, G. E. Ice, W. Liu, S. Einfeldt, D. Hommel, A. M. Roskowski, R. F. DavisVolume:
202
Year:
2005
Language:
english
Pages:
7
DOI:
10.1002/pssa.200461364
File:
PDF, 460 KB
english, 2005