Towards identification of degradation mechanisms in InGaN laser diodes grown on bulk GaN crystals
L. Marona, T. Riemann, J. Christen, T. Świetlik, G. Franssen, P. Wiśniewski, M. Leszczyński, P. Prystawko, I. Grzegory, T. Suski, S. Porowski, R. Czernecki, P. PerlinVolume:
203
Year:
2006
Language:
english
Pages:
5
DOI:
10.1002/pssa.200565316
File:
PDF, 219 KB
english, 2006