![](/img/cover-not-exists.png)
Time-resolved nanosecond sub-micron resolution thermal analysis of high-power AlGaN/GaN HFETs
M. Kuball, G. J. Riedel, J. W. Pomeroy, A. Sarua, M. J. Uren, T. Martin, K. P. Hilton, D. J. WallisVolume:
204
Year:
2007
Language:
english
Pages:
5
DOI:
10.1002/pssa.200674717
File:
PDF, 142 KB
english, 2007