Analysis of biaxial strain in InN(0001) epilayers grown by molecular beam epitaxy
E. Dimakis, J. Domagala, E. Iliopoulos, A. Adikimenakis, A. GeorgakilasVolume:
204
Year:
2007
Language:
english
Pages:
4
DOI:
10.1002/pssa.200674890
File:
PDF, 185 KB
english, 2007