White X-ray beam topography and radiography of Si1–xGex...

physica status solidi (a) 2007 Vol. 204; Iss. 8

White X-ray beam topography and radiography of Si1–xGex crystals bonded to silicon

T. S. Argunova, J. M. Yi, J. W. Jung, J. H. Je, L. M. Sorokin, M. Yu. Gutkin, E. I. Belyakova, L. S. Kostina, A. G. Zabrodskii, N. V. Abrosimov
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Volume:
204
Year:
2007
Language:
english
Pages:
6
DOI:
10.1002/pssa.200675667
File:
PDF, 664 KB
english, 2007
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