Combined double- and triple-crystal X-ray diffractometry with account for real defect structures in all crystals of X-ray optical schemes
A. P. Shpak, V. B. Molodkin, S. I. Olikhovskii, Ye. M. Kyslovskyy, O. V. Reshetnyk, T. P. Vladimirova, E. G. Len, A. I. Nizkova, V. M. Venger, S. V. DmitrievVolume:
204
Year:
2007
Language:
english
Pages:
6
DOI:
10.1002/pssa.200675700
File:
PDF, 339 KB
english, 2007