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[IEEE 2016 IEEE Applied Power Electronics Conference and Exposition (APEC) - Long Beach, CA, USA (2016.3.20-2016.3.24)] 2016 IEEE Applied Power Electronics Conference and Exposition (APEC) - Temperature-dependent turn-on loss analysis for GaN HFETs
Jones, Edward A., Wang, Fred, Costinett, Daniel, Zhang, Zheyu, Guo, BenYear:
2016
Language:
english
DOI:
10.1109/apec.2016.7467994
File:
PDF, 1004 KB
english, 2016