[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China...

  • Main
  • [IEEE 16th Asian Test Symposium (ATS...

[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Programmable Scan-Based Logic Built-In Self Test

Lai, Liyang, Lai, Liyang, Cheng, Wu-Tung, Cheng, Wu-Tung, Rinderknecht, Thomas, Rinderknecht, Thomas
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2007
Language:
english
DOI:
10.1109/ats.2007.4388041
File:
PDF, 293 KB
english, 2007
Conversion to is in progress
Conversion to is failed