Relationship between grain-boundary capacitance and bulk shallow donors in SnO2 polycrystalline semiconductor
P. R. Bueno, M. A. Santos, M. A. Ramírez, R. Tararam, E. Longo, J. A. VarelaVolume:
205
Year:
2008
Language:
english
Pages:
5
DOI:
10.1002/pssa.200723355
File:
PDF, 567 KB
english, 2008