In-situ X-ray scattering studies of OFET interfaces

In-situ X-ray scattering studies of OFET interfaces

Alexander Gerlach, Stefan Sellner, Stefan Kowarik, Frank Schreiber
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Volume:
205
Year:
2008
Language:
english
Pages:
14
DOI:
10.1002/pssa.200723411
File:
PDF, 1.19 MB
english, 2008
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