Microscopic and spectroscopic characterization of interfaces and dielectric layers for OFET devices
K. Müller, Y. Burkov, D. Mandal, K. Henkel, I. Paloumpa, A. Goryachko, D. SchmeißerVolume:
205
Year:
2008
Language:
english
Pages:
12
DOI:
10.1002/pssa.200723424
File:
PDF, 794 KB
english, 2008