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Aluminum oxide film as gate dielectric for organic FETs: Anodization and characterization
X.-D. Dang, W. Plieth, S. Richter, M. Plötner, W.-J. FischerVolume:
205
Year:
2008
Language:
english
Pages:
7
DOI:
10.1002/pssa.200723453
File:
PDF, 782 KB
english, 2008