[IEEE 2015 73rd Annual Device Research Conference (DRC) - Columbus, OH, USA (2015.6.21-2015.6.24)] 2015 73rd Annual Device Research Conference (DRC) - Out-of-plane strain effect on silicon-based flexible FinFETs
Ghoneim, Mohamed T., Alfaraj, Nasir, Torres Sevilla, Galo A., Fahad, Hossain M., Hussain, Muhammad M.Year:
2015
Language:
english
DOI:
10.1109/drc.2015.7175572
File:
PDF, 271 KB
english, 2015