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[IEEE 2016 European Frequency and Time Forum (EFTF) - York, United Kingdom (2016.4.4-2016.4.7)] 2016 European Frequency and Time Forum (EFTF) - Stress-sensitivity of wafer-level packaged SAW delay lines
Arapan, Lilia, Wong, Guillaume, Dulmet, Bernard, Baron, Thomas, Friedt, Jean-Michel, Placet, Vincent, Alzuaga, SebastienYear:
2016
Language:
english
DOI:
10.1109/eftf.2016.7477812
File:
PDF, 987 KB
english, 2016