Dielectric properties of InAsP alloy thin films and...

physica status solidi (a) 2008 Vol. 205; Iss. 4

Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters

S. G. Choi, D. E. Aspnes, N. A. Stoute, Y. D. Kim, H. J. Kim, Y.-C. Chang, C. J. Palmstrøm
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Volume:
205
Year:
2008
Language:
english
Pages:
4
DOI:
10.1002/pssa.200777848
File:
PDF, 660 KB
english, 2008
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