[IEEE 2015 IEEE 20th Conference on Emerging Technologies & Factory Automation (ETFA) - Luxembourg, Luxembourg (2015.9.8-2015.9.11)] 2015 IEEE 20th Conference on Emerging Technologies & Factory Automation (ETFA) - Verification of generalized inference diagnosability for decentralized diagnosis in discrete event systems
Takai, Shigemasa, Kumar, RatneshYear:
2015
Language:
english
DOI:
10.1109/etfa.2015.7301419
File:
PDF, 150 KB
english, 2015