[IEEE 2015 IEEE 20th Conference on Emerging Technologies...

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[IEEE 2015 IEEE 20th Conference on Emerging Technologies & Factory Automation (ETFA) - Luxembourg, Luxembourg (2015.9.8-2015.9.11)] 2015 IEEE 20th Conference on Emerging Technologies & Factory Automation (ETFA) - Verification of generalized inference diagnosability for decentralized diagnosis in discrete event systems

Takai, Shigemasa, Kumar, Ratnesh
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Year:
2015
Language:
english
DOI:
10.1109/etfa.2015.7301419
File:
PDF, 150 KB
english, 2015
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