Enhancement in ellipsometric thin film sensitivity near...

Enhancement in ellipsometric thin film sensitivity near surface plasmon resonance conditions

H. Arwin, M. Poksinski, K. Johansen
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Volume:
205
Year:
2008
Language:
english
Pages:
4
DOI:
10.1002/pssa.200777899
File:
PDF, 660 KB
english, 2008
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