Generalized ellipsometry determination of non-reciprocity...

Generalized ellipsometry determination of non-reciprocity in chiral silicon sculptured thin films

D. Schmidt, E. Schubert, M. Schubert
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Volume:
205
Year:
2008
Language:
english
Pages:
4
DOI:
10.1002/pssa.200777906
File:
PDF, 1014 KB
english, 2008
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