Si–SiO2 interface band-gap transition – effects on MOS inversion layer
Stanislav Markov, Peter V. Sushko, Scott Roy, Claudio Fiegna, Enrico Sangiorgi, Alexander L. Shluger, Asen AsenovVolume:
205
Year:
2008
Language:
english
Pages:
6
DOI:
10.1002/pssa.200778154
File:
PDF, 786 KB
english, 2008