Defect characterization and analysis of III-V nanowires...

Defect characterization and analysis of III-V nanowires grown by Ni-promoted MBE

L. Lari, R. T. Murray, M. H. Gass, T. J. Bullough, P. R. Chalker, J. Kioseoglou, G. P. Dimitrakopulos, Th. Kehagias, Ph. Komninou, Th. Karakostas, C. Chèze, L. Geelhaar, H. Riechert
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
205
Year:
2008
Language:
english
Pages:
4
DOI:
10.1002/pssa.200780132
File:
PDF, 251 KB
english, 2008
Conversion to is in progress
Conversion to is failed