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[IEEE 2004 International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (17-20 May 2004)] 2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) - Integration challenges of new materials and device architectures for IC applications
Bich-Yen Nguyen,, Thean, A., White, T., Vandooren, A., Sadaka, M., Mathew, L., Barr, A., Thomas, S., Zalava, M., Da Zhang,, Eades, D., Zhong-Hai Shi,, Schaeffer, J., Triyoso, D., Samavedam, S., VarYear:
2004
Language:
english
DOI:
10.1109/icicdt.2004.1309953
File:
PDF, 577 KB
english, 2004