New modes of FFT impedance spectroscopy applied to semiconductor pore etching and materials characterization
J. Carstensen, E. Foca, S. Keipert, H. Föll, M. Leisner, A. CojocaruVolume:
205
Year:
2008
Language:
english
Pages:
19
DOI:
10.1002/pssa.200824033
File:
PDF, 1.82 MB
english, 2008