[IEEE 2016 International Conference on Microelectronic Test Structures (ICMTS) - Yokohama, Japan (2016.3.28-2016.3.31)] 2016 International Conference on Microelectronic Test Structures (ICMTS) - Session 5: RF and power devices
McAndrew, ColinYear:
2016
DOI:
10.1109/icmts.2016.7476180
File:
PDF, 140 KB
2016