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[IEEE 2013 IEEE 7th International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications (IDAACS) - Berlin, Germany (2013.09.12-2013.09.14)] 2013 IEEE 7th International Conference on Intelligent Data Acquisition and Advanced Computing Systems (IDAACS) - Wavelet transform domain adaptive clustering for electronic product quality inspection
Shcherbakova, Galina, Krylov, Viktor, Pisarenko, Radmila, Kuzmenko, VadymYear:
2013
Language:
english
DOI:
10.1109/idaacs.2013.6662660
File:
PDF, 968 KB
english, 2013