[IEEE 2014 IEEE International Nanoelectronics Conference (INEC) - Sapporo, Japan (2014.7.28-2014.7.31)] 2014 IEEE International Nanoelectronics Conference (INEC) - Recent development in simulation and multivariate statistical analysis of physical characteristics of dispersive ensembles of semiconductor nano-sized objects: A brief review
Voskoboynikov, O.Year:
2014
Language:
english
DOI:
10.1109/inec.2014.7460435
File:
PDF, 1.03 MB
english, 2014