X-ray characterization of epi-Ge/Pr2O3/Si(111) layer stacks...

X-ray characterization of epi-Ge/Pr2O3/Si(111) layer stacks by pole figures and reciprocal space mapping

Peter Zaumseil, Alessandro Giussani, Peter Rodenbach, Thomas Schroeder
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Volume:
206
Year:
2009
Language:
english
Pages:
7
DOI:
10.1002/pssa.200881581
File:
PDF, 4.90 MB
english, 2009
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