X-ray characterization of epi-Ge/Pr2O3/Si(111) layer stacks by pole figures and reciprocal space mapping
Peter Zaumseil, Alessandro Giussani, Peter Rodenbach, Thomas SchroederVolume:
206
Year:
2009
Language:
english
Pages:
7
DOI:
10.1002/pssa.200881581
File:
PDF, 4.90 MB
english, 2009