X-ray diffraction study of strain and defect structure of nonpolar a-plane GaN-layers grown on r-plane sapphire
R. N. Kyutt, M. P. Shcheglov, V. V. Ratnikov, A. E. KalmykovVolume:
206
Year:
2009
Language:
english
Pages:
4
DOI:
10.1002/pssa.200881611
File:
PDF, 1022 KB
english, 2009