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Electrical, structural and optical characterization of copper oxide thin films as a function of post annealing temperature
V. Figueiredo, E. Elangovan, G. Gonçalves, N. Franco, E. Alves, S.H.K. Park, R. Martins, E. FortunatoVolume:
206
Year:
2009
Language:
english
Pages:
6
DOI:
10.1002/pssa.200881797
File:
PDF, 462 KB
english, 2009