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Sequential analysis of diamond nucleation on silicon (001) with bias enhanced nucleation using X-ray photoelectron spectroscopy and reflection high energy electron diffraction investigations
C. Sarrieu, N. Barth, A. Guise, J. C. Arnault, S. Saada, S. Barrat, E. Bauer-GrosseVolume:
206
Year:
2009
Language:
english
Pages:
5
DOI:
10.1002/pssa.200982234
File:
PDF, 449 KB
english, 2009