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Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
Jakub Holovský, Űmit Dagkaldiran, Zdeněk Remeš, Adam Purkrt, Tibor Ižák, Aleš Poruba, Milan VaněčekVolume:
207
Year:
2010
Language:
english
Pages:
4
DOI:
10.1002/pssa.200982890
File:
PDF, 489 KB
english, 2010