Fourier transform photocurrent measurement of thin silicon...

Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates

Jakub Holovský, Űmit Dagkaldiran, Zdeněk Remeš, Adam Purkrt, Tibor Ižák, Aleš Poruba, Milan Vaněček
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Volume:
207
Year:
2010
Language:
english
Pages:
4
DOI:
10.1002/pssa.200982890
File:
PDF, 489 KB
english, 2010
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