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[IEEE 2015 IEEE International Conference on Systems, Man, and Cybernetics (SMC) - Kowloon Tong, Hong Kong (2015.10.9-2015.10.12)] 2015 IEEE International Conference on Systems, Man, and Cybernetics - What is an Effective Feature for a Detection Problem? Feature Evaluation in Multiple Scenes
Yamabe, Tomoaki K., Miyashita, Yudai, Sato, Shin'ichi, Yamamoto, Yudai, Nakamura, Akio, Kataoka, HirokatsuYear:
2015
Language:
english
DOI:
10.1109/smc.2015.509
File:
PDF, 470 KB
english, 2015