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MicroRaman studies of implantation-induced amorphization of Si and subsequent regrowth under high-pressure and high-temperature treatment
Yu. M. Azhniuk, P. Schäfer, A. V. Gomonnai, A. Misiuk, M. Prujszczyk, D. R. T. ZahnVolume:
207
Year:
2010
Language:
english
Pages:
5
DOI:
10.1002/pssa.201026248
File:
PDF, 274 KB
english, 2010