Rapid dislocation-related D1-photoluminescence imaging of...

Rapid dislocation-related D1-photoluminescence imaging of multicrystalline Si wafers at room temperature

R. P. Schmid, D. Mankovics, T. Arguirov, M. Ratzke, T. Mchedlidze, M. Kittler
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Volume:
208
Year:
2011
Language:
english
Pages:
5
DOI:
10.1002/pssa.201026269
File:
PDF, 334 KB
english, 2011
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