Imaging and identifying defects in nitride semiconductor...

physica status solidi (a) 2012 Vol. 209; Iss. 3

Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope

G. Naresh-Kumar, B. Hourahine, A. Vilalta-Clemente, P. Ruterana, P. Gamarra, C. Lacam, M. Tordjman, M. A. di Forte-Poisson, P. J. Parbrook, A. P. Day, G. England, C. Trager-Cowan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
209
Year:
2012
Language:
english
Pages:
3
DOI:
10.1002/pssa.201100416
File:
PDF, 216 KB
english, 2012
Conversion to is in progress
Conversion to is failed