Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement
Salzenstein, Fabien, Montgomery, Paul C., Montaner, Denis, Boudraa, Abdel-OuahabVolume:
2005
Language:
english
Journal:
EURASIP Journal on Advances in Signal Processing
DOI:
10.1155/asp.2005.2804
Date:
December, 2005
File:
PDF, 820 KB
english, 2005