Back Cover: Kelvin probe force microscopy in the presence...

Back Cover: Kelvin probe force microscopy in the presence of intrinsic local electric fields (Phys. Status Solidi A 4/2011)

Christine Baumgart, Anne-Dorothea Müller, Falk Müller, Heidemarie Schmidt
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Volume:
208
Year:
2011
Pages:
1
DOI:
10.1002/pssa.201190013
File:
PDF, 1.87 MB
2011
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