Electronic properties of the SiSiO2 interface as a function...

Electronic properties of the SiSiO2 interface as a function of oxide growth conditions. I. Surface states

J. L. Pautrat, J. C. Pfister
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Volume:
11
Year:
1972
Language:
english
Pages:
10
DOI:
10.1002/pssa.2210110130
File:
PDF, 576 KB
english, 1972
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