Use of atomic force microscopy for examining wet clay

Clays and Clay Minerals 2006 / 02 Vol. 54; Iss. 1

Use of atomic force microscopy for examining wet clay

Selvam, Arunkumar, See, Chun Hwa, Barkdoll, Brian, Prasad, Shyam, O'Haver, John
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Volume:
54
Language:
english
Journal:
Clays and Clay Minerals
DOI:
10.1346/ccmn.2006.0540103
Date:
February, 2006
File:
PDF, 236 KB
english, 2006
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