Measurement of lattice parameter differences on...

physica status solidi (a) 1973 Vol. 15; Iss. 2

Measurement of lattice parameter differences on semiconductor crystals due to diffusion doping

P. N. Ignacz, A. T. Nagy, L. Varga
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Volume:
15
Year:
1973
Language:
english
Pages:
1
DOI:
10.1002/pssa.2210150248
File:
PDF, 576 KB
english, 1973
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