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Effect of impurities on the radiation sensitivity of the SiSiO2 interface in MIS structures
V. A. Girii, A. V. Kondrachuk, S. I. Kornyushin, V. G. Litovchenko, R. O. Litvinov, S. I. ShakhovtsovVolume:
34
Year:
1976
Language:
english
Pages:
1
DOI:
10.1002/pssa.2210340151
File:
PDF, 194 KB
english, 1976