Effect of impurities on the radiation sensitivity of the...

Effect of impurities on the radiation sensitivity of the SiSiO2 interface in MIS structures

V. A. Girii, A. V. Kondrachuk, S. I. Kornyushin, V. G. Litovchenko, R. O. Litvinov, S. I. Shakhovtsov
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
34
Year:
1976
Language:
english
Pages:
1
DOI:
10.1002/pssa.2210340151
File:
PDF, 194 KB
english, 1976
Conversion to is in progress
Conversion to is failed