Design of a novel static-triggered power-rail ESD clamp circuit in a 65-nm CMOS process
Lu, Guangyi, Wang, Yuan, Zhang, Lizhong, Cao, Jian, Zhang, XingVolume:
59
Language:
english
Journal:
Science China Information Sciences
DOI:
10.1007/s11432-015-5455-y
Date:
December, 2016
File:
PDF, 772 KB
english, 2016