Measurements of small-signal photo-EMF of Si and Ge MIS...

Measurements of small-signal photo-EMF of Si and Ge MIS structures using scanning light probe

R. S. Nakhmanson, L. K. Popov
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Volume:
46
Year:
1978
Language:
english
Pages:
10
DOI:
10.1002/pssa.2210460106
File:
PDF, 590 KB
english, 1978
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