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On a semiparametric regression model whose errors form a linear process with negatively associated innovations
Liang, Han-Ying, Mammitzsch, Volker, Steinebach, JosefVolume:
40
Language:
english
Journal:
Statistics
DOI:
10.1080/02331880600688163
Date:
June, 2006
File:
PDF, 325 KB
english, 2006