IR spectroscopy and X-ray topography study of annealing of...

IR spectroscopy and X-ray topography study of annealing of proton bombarded silicon

J. Tatarkiewicz, K. Wieteska
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Volume:
66
Year:
1981
Language:
english
Pages:
1
DOI:
10.1002/pssa.2210660252
File:
PDF, 126 KB
english, 1981
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