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Temperature dependence of capacitance-voltage characteristics in implanted MOS structures
V. S. Lysenko, R. N. Litovskii, A. N. Nazarov, V. P. KulichkovVolume:
70
Year:
1982
Language:
english
Pages:
10
DOI:
10.1002/pssa.2210700242
File:
PDF, 610 KB
english, 1982