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Study of Imperfections in Ge–Te Semiconductors by the Positron Annihilation Technique
B. V. Kobrin, R. M. Kupriyanova, V. S. Minaev, E. P. Prokopiev, V. P. ShantarovichVolume:
73
Year:
1982
Language:
english
Pages:
4
DOI:
10.1002/pssa.2210730204
File:
PDF, 276 KB
english, 1982