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Nature of the Defect Determining the Fermi Level Stabilization in Irradiated Silicon
P. F. Lugakov, T. A. Lukashevich, V. V. ShushaVolume:
74
Year:
1982
Language:
english
Pages:
8
DOI:
10.1002/pssa.2210740209
File:
PDF, 561 KB
english, 1982